Industrial and Intellectual Property

  • A statistical approach to prediction of the cmm drift behaviour using a calibrated mechanical artefact [2015]

    Category:
    Artículos
    Authors:
    Daniel González Madruga , Fernando Sánchez Lasheras , Braulio José Álvarez Álvarez , Eduardo Cuesta González
    Date:
    01 of January of 2015
    It Is a Part of:
    Metrology And Measurement Systems